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| Line 46: | Line 46: | ||
*'''Keynumbers'''  | *'''Keynumbers'''  | ||
**ANL Publications #: 	59825  | **ANL Publications #: 	59825  | ||
| + | |||
| + | ----  | ||
| + | |||
| + | ====Passive millimeter wave sensor for remote chemical detection.====  | ||
| + | |||
| + | *'''Type:''' Full Length Public Comm. (Award Entry)  | ||
| + | *'''Date Cleared:''' 03/13/2007  | ||
| + | *'''Authors:''' Gopalsami, N.;Bakhitari, S.;Raptis, A.;Elmer, T.  | ||
| + | *'''Submitted To:''' R&D Magazine (R&D100 Awards)  | ||
| + | **DVD to accompany entry  | ||
| + | *'''Affiliations'''  | ||
| + | **ANL Divisions: 	NE;OTT;TSD  | ||
| + | *'''Keynumbers'''  | ||
| + | **ANL Publications #: 	58677  | ||
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Revision as of 23:33, 1 June 2009
Contents
- 1 Millimeter wave sensor for far-field standoff vibrometry.
 - 2 Development of flaw sizing algorithms for eddy current rotating probes.
 - 3 Application of millimeter-wave radiometry for remote chemical detection.
 - 4 A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.
 - 5 Remote detection of chemicals with passive millimeter waves.
 - 6 A computer-aided analysis tool for flaw sizing based on eddy current inspection data.
 
Millimeter wave sensor for far-field standoff vibrometry.
- Type: Full Length Conf. Paper
 - Date Cleared: 09/05/2008, 05/12/2008 (abstract)
 - Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T. W.;Raptis, A. C.
 - Conference: 35th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2008)
 - Location: Chicago, IL
 - Conference Date: Jul. 20, 2008 - Jul. 25, 2008
 - Report No.: ANL/NE/CP-62458
 - Affiliations
- ANL Divisions: NE
 
 - Keynumbers
- ANL Publications #: 62458, 61637 (abstract)
 - Associated Project Reference #: 2007-113-R1, 03887-00 (abstract)
 
 
Development of flaw sizing algorithms for eddy current rotating probes.
- Type: Abstract Conf. Paper
 - Date Cleared: 04/22/2008
 - Authors: Bakhtiari, S.;Elmer, T. W.
 - Conference: EPRI 27th Steam Generator NDE Workshop
 - Location: Palm Desert, CA
 - Conference Date: Jul. 21, 2008 - Jul. 23, 2008
 - Affiliations
- ANL Divisions: NE
 
 - Keynumbers
- ANL Publications #: 61543
 
 
Application of millimeter-wave radiometry for remote chemical detection.
- Type: Full Length Journal Article
 - Date Cleared: 08/09/2007
 - Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T. W.;Raptis, A. C.
 - Submitted To: IEEE Trans. on Microwave Theory Tech.
 - Published In: IEEE Trans. on Microwave Theory Tech.
- Volume: 56
 - Issue: 3
 - Pages: 700-709
 - Issue Date: Mar. 2008
 
 - Affiliations
- ANL Divisions: NE
 
 - Keynumbers
- ANL Publications #: 59825
 
 
Passive millimeter wave sensor for remote chemical detection.
- Type: Full Length Public Comm. (Award Entry)
 - Date Cleared: 03/13/2007
 - Authors: Gopalsami, N.;Bakhitari, S.;Raptis, A.;Elmer, T.
 - Submitted To: R&D Magazine (R&D100 Awards)
- DVD to accompany entry
 
 - Affiliations
- ANL Divisions: NE;OTT;TSD
 
 - Keynumbers
- ANL Publications #: 58677
 
 
A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.
- Type: Full Length Conf. Paper
 - Date Cleared: 11/30/2006, 04/12/2007
 - Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T.;Raptis, A. C.
 - Conference: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC 2007)
 - Location: St. Louis, MO
 - Conference Date: Jun. 27, 2007 - Jun. 29, 2007
 - Report No.: ANL/NE/CP-57949, ANL/NE/CP-58996
 - Affiliations
- ANL Divisions: NE
 
 - Keynumbers
- ANL Publications #: 57949, 58996
 
 
Remote detection of chemicals with passive millimeter waves.
- Type: Full Length Conf. Paper
 - Date Cleared: 09/25/2006, 04/07/2006 (abstract)
 - Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T.;Raptis, A. C.
 - Conference Sponsor: DOE
 - Conference: SPIE Conference on Chemical and Biological Sensors for Industrial and Environmental Monitoring
 - Location: Boston, MA
 - Conference Date: Oct. 3, 2006 - Oct. 4, 2006
 - Report No.: ANL/NE/CP-119279
 - Affiliations
- ANL Divisions: ET
 
 - Keynumbers
- ANL Publications #: 57409, 56082 (abstract)
 - Other ID #s: 119279
 
 
A computer-aided analysis tool for flaw sizing based on eddy current inspection data.
- Type: Full Length Other
 - Date Cleared: 07/07/2005, 04/01/2005 (abstract)
 - Authors: Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
 - Conference Sponsor: EPRI/NRC
 - Conference: 24th Annual EPRI Steam Generator NDE Workshop
 - Location: San Diego, CA
 - Conference Date: Jul. 11, 2005 - Jul. 13, 2005
 - Affiliations
- ANL Divisions: ET
 
 - Keynumbers
- ANL Publications #: 53859, 53004 (abstract)
 - Other ID #s: 116561, 115802 (abstract)